Optical microscopy, scanning electron microscopy (SEM), and X-ray microscopy are employed individually or collectively depending upon research requirements.
Energy dispersive X-ray spectroscopy is used to identify phases and provide quantitative elemental analyses. Elemental mapping is done with a scanning electron microscope and an X-ray microscope.
All of our microscopes are capable of capturing high-quality digital images. Image analysis techniques are used when suitable, helping to ensure accuracy and improve productivity.
Epifluorescent techniques are used to characterize the finest features of air-void and pore structures in materials.
A wet chemical laboratory is also available and can be used for a variety of analyses, both chemical and physical.
FEI XL40 Environemental Scanning Electron Microscope
- EDAX EDS X-ray spectrometer
- Hot and cold stages
- Electron back-scatter detector
Horiba XGT-200W X-ray Microscope
Olympus BX60 Polarized Light Petrographic Microscope
Olympus SZH10 Stereo-Zoom Optical Microscope
Logitech IU30 Vacuum Impregnation Unit
Logitech CS10 Thin Section Cutoff Saw
Ingram Laboratories Model 204 Thin Section Grinder
Lapmaster 12 Precision Lapping Machine
Buehler Ecomet Variale-Speed Grinder and Polisher
With Automet 2 power head